Atomic Force Microscopy for Nanotechnology, Scientific Research & Education

TITANIUM
AFM - Raman - SNOM
Bio AFM
Modular AFM
Automated AFM
Practical AFM
•  Record breaking Raman enhancement factors
•  Nano-Raman spatial resolution: down 10nm
•  High speed TERS* mapping
•  Mass produced, based on serial AFM cantilevers
•  Complete commercial solution for TERS
Fully automated AFM/STM TITANIUM.  NT-MDT - AFM-probes, atomic force microscope (AFM, STM, SPM, RAMAN, SNOM)
Atomic Force Microscope for Research & Education
SOLVER Nano &ndash Atomic Force Microscope for Research & Education
New AFM technique
Comprehensive materials characterization
Ultimate resolution, quantitative analysis
Morphological, mechanical, chemical, electric, magnetic and
other properties within a single scan

Compatible with: TITANIUM, NEXT, NTEGRA Prima,
NTEGRA Spectra, SPECTRUM and LIFE systems
Interdisciplinary research at the nanometer scale:
AFM+Confocal Raman+SNOM+TERS
NTEGRA Spectra – Atomic Force Microscope integrated with Confocal Raman and  SNOM systems
Fully automated Atomic Force Microscope
integrated with Inverted Light Microscope
for Biological Research
LIFE – Fully automated Atomic Force Microscope integrated with Inverted Light Microscope
Automated AFM-Raman-SNOM system for a wide range of applications
 
 

Manchester Central, UK. June 29 - July 2, 2015
MMC2015: all about microscopy

UTRECHT,Netherlands. July, 12-15, 2015
Homogeneous and Heterogeneous Catalysis

Vienna,Austria. July, 12-17, 2015

Boston, United States. August, 16-20, 2015
 

Webinars

Archived webinars
    New Developments in AFM Oscillatory Resonance
    Modes: Frequency Imaging and Frequency
    Modulation
    Please click here to view the webinar

    High-Resolution and Quantitative AFM Mapping
    of Mechanical Properties of Polymers
    Please click here to view the webinar

Unique cantilever-type TERS probes for
nano-Raman imaging

Record Raman enhancement factors, highest nano-Raman spatial resolution and excellent AFM performance. Read more
Image of TERS probe
 
 
 
Copyright © 1998 - 2015, NT-MDT